Spaeth, Johann-Martin: International Conference on Defects in Semiconductors : Proceedings of the International Conference on Defects in Semiconductors. (Materials Science Forum 10-12) / Application of optically detected magnetic resonance to the characterization of point defects in semiconductors. . In: International Conference on Defects in Semiconductors : Proceedings of the International Conference on Defects in Semiconductors. (Materials Science Forum 10-12). Jg.1986, S.505514