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Title
Application of modern magnetic resonance techniques to the characterization of point defects in semi-insulating III-V semiconductors
AuthorSpaeth, Johann-Martin
Published in
Place and Date of Creation2009
LanguageEnglish
Document TypesArticle in a collected edition
URNurn:nbn:de:hbz:466:2-6282 
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Application of modern magnetic resonance techniques to the characterization of point defects in semi-insulating III-V semiconductors [0.41 mb]
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