An applied noise model for scintillation-based CCD detectors in transmission electron microscopy / Christian Zietlow & Jörg K. N. Lindner. In: scientific reports. Paderborn : Universitätsbibliothek, 2025
Content
- Gaussian noise
- The noise model
- Binning of the detector
- Evaluation of the noise model
- Signal and fixed-pattern noise
- The fixed-pattern noise of the gain reference
- The brighter-fatter effect
- Correction of gain non-linearities
- Binning of signal and fixed-pattern noises
- Beam correlations and the reconstruction of the detector PSF
- Theoretical considerations on STEM-EELS measurements
- Conclusions
- References