A novel Lagrangian-based method for the deconvolution of electron energy-loss spectra / von Christian Zietlow ; Erstgutachter : Prof. Dr. Jörg K. N. Lindner, Universität Paderborn, Zweitgutachter : Prof. Dr. Arno Schindlmayr, Universität Paderborn. Paderborn, 2025
Inhalt
- Introduction
- Plasmonic nanoparticles
- Transmission electron microscopy (TEM)
- The current state-of-the-art
- Noise models in TEM
- Noise fundamentals
- Noises in TEM imaging
- Noises of EEL spectra
- Current noise models employed in EELS
- Deconvolution techniques employed in EELS
- Summary of the publications and the thesis
- Bibliography
- An applied noise model for scintillation-based CCD detectors in transmission electron microscopy
- An applied noise model for low-loss EELS maps
- ADMM-TGV image restoration for scientific applications with unbiased parameter choice
- An unbiased ADMM-TGV algorithm for the deconvolution of STEM-EELS maps