TY  - CHAP
AU  - Spaeth, Johann-Martin
DP  - Universität Paderborn
LA  - eng
PY  - 2009
SN  - 4-274-02113-0
SP  - 299-304
T2  - Semi-insulating III - V Materials: Hakone 1986
TI  - Application of modern magnetic resonance techniques to the characterization of point defects in semi-insulating III-V semiconductors
UR  - https://nbn-resolving.org/urn:nbn:de:hbz:466:2-6282
VL  - 1986
Y2  - 2026-10-02T18:35:31
ER  -