TY  - CHAP
AU  - Spaeth, Johann-Martin
DP  - Universität Paderborn
LA  - eng
PY  - 2009
SN  - 0-87849-551-7
SP  - 505-514
T3  - International Conference on Defects in Semiconductors : Proceedings of the International Conference on Defects in Semiconductors. (Materials Science Forum 10-12)
TI  - Application of optically detected magnetic resonance to the characterization of point defects in semiconductors
UR  - https://nbn-resolving.org/urn:nbn:de:hbz:466:2-6291
Y2  - 2025-06-21T12:10:46
ER  -