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Title
The determination of chemical concentrations in cano-scaled phases by use of quantitative anomalous small-angle X-ray scattering / Günter Johannes Goerigk, Institut für Weiche Materie und Funktionale Materialien des Helmholtz-Zentrum Berlin ; [Synopse der Kumulativen Habilitationsschrift]
AuthorGoerigk, Günter
ParticipantsStuhrmann, Heinrich B.
PublishedPaderborn, 2012
Edition
Elektronische Ressource
Description1 Online-Ressource (32 Seiten)
Institutional NoteUniversität Paderborn, Univ., Habilitationsschrift, 2012
Annotation
Tag der Verteidigung: 02.12.2012
Defended on2012-12-02
LanguageGerman
Document TypesHabilitation Thesis
URNurn:nbn:de:hbz:466:2-27468 
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The determination of chemical concentrations in cano-scaled phases by use of quantitative anomalous small-angle X-ray scattering [4.08 mb]
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Abstract (English)

In the last years Anomalous Small-Angle X-ray Scattering became a precisequantitative method resolving scattering contributions two or three orders of magnitudesmaller compared to the overall small-angle scattering, which are related to the so-calledpure-resonant scattering contribution. Additionally to the structural information precisequantitative information about the different chemical constituents of multi-componentsystems like the fraction of the chemical components localized in the nanostructure of thematerials are obtained from these scattering contributions. The application of the Gausselimination algorithm to the vector equation established by ASAXS measurements at three Xrayenergies is demonstrated for three examples from chemistry and solid state physics. Allexamples deal with the quantitative analysis of the Resonant Invariant (RI-analysis). From theintegrals of the pure-resonant scattering contribution the chemical concentrations in nanoscaledphases are determined. In one example the correlated analysis of the ResonantInvariant and the Non-resonant Invariant (NI-analysis) is employed. The structural andquantitative informations are correlated to the macroscopic properties respectively to theproperties of the phase diagrams of the analyzed materials.