Bibliographic Metadata

• Title
  Application of modern magnetic resonance techniques to the characterization of point defects in semi-insulating III-V semiconductors
• Author
  Spaeth, Johann-Martin
• Is part of
  Semi-insulating III - V Materials: Hakone 1986, Tokyo, 1986, page 299-304
• Place and Date of Creation
  2009
• Language
  English
• Document Types
  Article in a collected edition
• ISBN
  4-274-02113-0
• URN
  urn:nbn:de:hbz:466:2-6282