Bibliographic Metadata

• Title
  Application of optically detected magnetic resonance to the characterization of point defects in semiconductors
• Author
  Spaeth, Johann-Martin
• Published in
  International Conference on Defects in Semiconductors : Proceedings of the International Conference on Defects in Semiconductors. (Materials Science Forum 10-12), Paris, 1986, page 505-514
• Place and Date of Creation
  2009
• Language
  English
• Document Types
  Article in a collected edition
• URN
  urn:nbn:de:hbz:466:2-6291