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Bibliographic Metadata
Title
Application of optically detected magnetic resonance to the characterization of point defects in semiconductors
Author
Spaeth, Johann-Martin
Is part of
International Conference on Defects in Semiconductors : Proceedings of the International Conference on Defects in Semiconductors. (Materials Science Forum 10-12), Paris, 1986, page 505-514
Place and Date of Creation
2009
Language
English
Document Types
Article in a collected edition
ISBN
0-87849-551-7
URN
urn:nbn:de:hbz:466:2-6291
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Universitätsbibliothek Paderborn
IIIF
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Application of optically detected magnetic resonance to the characterization of point defects in semiconductors
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Fakultät für Naturwissenschaften
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Department Physik
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Naturwissenschaften und Mathematik
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Physik
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Physik
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