de
en
Close
Detailsuche
Bibliotheken
Projekt
Imprint
Privacy Policy
Close
Publizieren
Besondere Sammlungen
Digitalisierungsservice
Hilfe
Impressum
Datenschutz
jump to main content
Search Details
Quicksearch:
OK
Title
Title
Content
Content
Page
Page
The search-operation requires javascript to be activated.
The search-operation requires javascript to be activated.
Bibliographic Metadata
Title
Application of optically detected magnetic resonance to the characterization of point defects in semiconductors
Author
Spaeth, Johann-Martin
Published in
International Conference on Defects in Semiconductors : Proceedings of the International Conference on Defects in Semiconductors. (Materials Science Forum 10-12)
, Paris, 1986, page 505-514
Place and Date of Creation
2009
Language
English
Document Types
Article in a collected edition
URN
urn:nbn:de:hbz:466:2-6291
Files
Application of optically detected magnetic resonance to the characterization of point defects in semiconductors
[0.51 mb]
Links
Download
RIS
Social Media
Share
Reference
Universitätsbibliothek Paderborn
IIIF
IIIF Manifest
Classification
Besondere Sammlungen
→
Veröffentlichungen der Universität
→
Fakultät für Naturwissenschaften
→
Department Physik
Klassifikation (DDC)
→
Naturwissenschaften und Mathematik
→
Physik
→
Physik
Content
Contents of this Book
Stats
The PDF-Document has been downloaded
160
times.
The search-operation requires javascript to be activated.